If a query is made of a vector ssa_def (possibly from an intermediate
result), return all_bits. If a constant source is a vector, swizzle
the correct component.
Unit tests were added for the constant vector cases. I don't see a
great way to make unit tests for the other cases.
v2: Add a FINIHSME comment about u16vec2 hardware.
Fixes: 96303a59ea ("nir: Add some range analysis for used bits")
Reviewed-by: Jason Ekstrand <jason@jlekstrand.net>
Part-of: <https://gitlab.freedesktop.org/mesa/mesa/-/merge_requests/9123>
258 lines
8.2 KiB
C++
258 lines
8.2 KiB
C++
/*
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* Copyright © 2021 Intel Corporation
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*
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* Permission is hereby granted, free of charge, to any person obtaining a
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* copy of this software and associated documentation files (the "Software"),
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* to deal in the Software without restriction, including without limitation
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* the rights to use, copy, modify, merge, publish, distribute, sublicense,
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* and/or sell copies of the Software, and to permit persons to whom the
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* Software is furnished to do so, subject to the following conditions:
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*
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* The above copyright notice and this permission notice (including the next
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* paragraph) shall be included in all copies or substantial portions of the
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* Software.
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*
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* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
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* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
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* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
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* THE AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
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* LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING
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* FROM, OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER
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* DEALINGS IN THE SOFTWARE.
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*/
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#include <gtest/gtest.h>
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#include "nir.h"
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#include "nir_builder.h"
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#include "nir_range_analysis.h"
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class ssa_def_bits_used_test : public ::testing::Test {
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protected:
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ssa_def_bits_used_test()
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{
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glsl_type_singleton_init_or_ref();
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static const nir_shader_compiler_options options = { };
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bld = nir_builder_init_simple_shader(MESA_SHADER_VERTEX, &options,
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"ssa_def_bits_used test");
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}
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~ssa_def_bits_used_test()
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{
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ralloc_free(bld.shader);
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glsl_type_singleton_decref();
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}
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nir_alu_instr *build_alu_instr(nir_op op, nir_ssa_def *, nir_ssa_def *);
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struct nir_builder bld;
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};
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static bool
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is_used_once(const nir_ssa_def *def)
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{
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return list_is_singular(&def->uses) &&
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list_is_empty(&def->if_uses);
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}
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nir_alu_instr *
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ssa_def_bits_used_test::build_alu_instr(nir_op op,
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nir_ssa_def *src0, nir_ssa_def *src1)
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{
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nir_ssa_def *def = nir_build_alu(&bld, op, src0, src1, NULL, NULL);
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if (def == NULL)
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return NULL;
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nir_alu_instr *alu = nir_instr_as_alu(def->parent_instr);
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if (alu == NULL)
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return NULL;
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alu->dest.write_mask = 1;
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alu->dest.dest.ssa.num_components = 1;
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return alu;
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}
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TEST_F(ssa_def_bits_used_test, iand_with_const_vector)
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{
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static const unsigned src0_imm[4] = { 255u << 24, 255u << 16, 255u << 8, 255u };
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nir_ssa_def *src0 = nir_imm_ivec4(&bld,
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src0_imm[0], src0_imm[1],
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src0_imm[2], src0_imm[3]);
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nir_ssa_def *src1 = nir_imm_int(&bld, 0xffffffff);
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nir_alu_instr *alu = build_alu_instr(nir_op_iand, src0, src1);
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ASSERT_NE((void *) 0, alu);
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for (unsigned i = 0; i < 4; i++) {
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/* If the test is changed, and somehow src1 is used multiple times,
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* nir_ssa_def_bits_used will accumulate *all* the uses (as it should).
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* This isn't what we're trying to test here.
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*/
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ASSERT_TRUE(is_used_once(src1));
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alu->src[0].swizzle[0] = i;
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const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[1].src.ssa);
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/* The answer should be the value swizzled from src0. */
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EXPECT_EQ(src0_imm[i], bits_used);
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}
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}
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TEST_F(ssa_def_bits_used_test, ior_with_const_vector)
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{
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static const unsigned src0_imm[4] = { 255u << 24, 255u << 16, 255u << 8, 255u };
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nir_ssa_def *src0 = nir_imm_ivec4(&bld,
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src0_imm[0], src0_imm[1],
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src0_imm[2], src0_imm[3]);
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nir_ssa_def *src1 = nir_imm_int(&bld, 0xffffffff);
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nir_alu_instr *alu = build_alu_instr(nir_op_ior, src0, src1);
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ASSERT_NE((void *) 0, alu);
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for (unsigned i = 0; i < 4; i++) {
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/* If the test is changed, and somehow src1 is used multiple times,
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* nir_ssa_def_bits_used will accumulate *all* the uses (as it should).
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* This isn't what we're trying to test here.
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*/
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ASSERT_TRUE(is_used_once(src1));
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alu->src[0].swizzle[0] = i;
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const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[1].src.ssa);
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/* The answer should be the value swizzled from ~src0. */
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EXPECT_EQ(~src0_imm[i], bits_used);
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}
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}
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TEST_F(ssa_def_bits_used_test, extract_i16_with_const_index)
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{
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nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff);
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static const unsigned src1_imm[4] = { 9, 1, 0, 9 };
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nir_ssa_def *src1 = nir_imm_ivec4(&bld,
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src1_imm[0],
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src1_imm[1],
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src1_imm[2],
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src1_imm[3]);
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nir_alu_instr *alu = build_alu_instr(nir_op_extract_i16, src0, src1);
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ASSERT_NE((void *) 0, alu);
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for (unsigned i = 1; i < 3; i++) {
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/* If the test is changed, and somehow src1 is used multiple times,
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* nir_ssa_def_bits_used will accumulate *all* the uses (as it should).
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* This isn't what we're trying to test here.
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*/
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ASSERT_TRUE(is_used_once(src1));
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alu->src[1].swizzle[0] = i;
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const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa);
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EXPECT_EQ(0xffffu << (16 * src1_imm[i]), bits_used);
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}
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}
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TEST_F(ssa_def_bits_used_test, extract_u16_with_const_index)
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{
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nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff);
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static const unsigned src1_imm[4] = { 9, 1, 0, 9 };
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nir_ssa_def *src1 = nir_imm_ivec4(&bld,
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src1_imm[0],
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src1_imm[1],
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src1_imm[2],
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src1_imm[3]);
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nir_alu_instr *alu = build_alu_instr(nir_op_extract_u16, src0, src1);
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ASSERT_NE((void *) 0, alu);
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for (unsigned i = 1; i < 3; i++) {
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/* If the test is changed, and somehow src1 is used multiple times,
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* nir_ssa_def_bits_used will accumulate *all* the uses (as it should).
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* This isn't what we're trying to test here.
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*/
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ASSERT_TRUE(is_used_once(src1));
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alu->src[1].swizzle[0] = i;
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const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa);
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EXPECT_EQ(0xffffu << (16 * src1_imm[i]), bits_used);
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}
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}
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TEST_F(ssa_def_bits_used_test, extract_i8_with_const_index)
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{
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nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff);
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static const unsigned src1_imm[4] = { 3, 2, 1, 0 };
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nir_ssa_def *src1 = nir_imm_ivec4(&bld,
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src1_imm[0],
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src1_imm[1],
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src1_imm[2],
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src1_imm[3]);
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nir_alu_instr *alu = build_alu_instr(nir_op_extract_i8, src0, src1);
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ASSERT_NE((void *) 0, alu);
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for (unsigned i = 0; i < 4; i++) {
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/* If the test is changed, and somehow src1 is used multiple times,
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* nir_ssa_def_bits_used will accumulate *all* the uses (as it should).
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* This isn't what we're trying to test here.
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*/
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ASSERT_TRUE(is_used_once(src1));
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alu->src[1].swizzle[0] = i;
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const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa);
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EXPECT_EQ(0xffu << (8 * src1_imm[i]), bits_used);
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}
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}
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TEST_F(ssa_def_bits_used_test, extract_u8_with_const_index)
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{
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nir_ssa_def *src0 = nir_imm_int(&bld, 0xffffffff);
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static const unsigned src1_imm[4] = { 3, 2, 1, 0 };
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nir_ssa_def *src1 = nir_imm_ivec4(&bld,
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src1_imm[0],
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src1_imm[1],
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src1_imm[2],
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src1_imm[3]);
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nir_alu_instr *alu = build_alu_instr(nir_op_extract_u8, src0, src1);
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ASSERT_NE((void *) 0, alu);
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for (unsigned i = 0; i < 4; i++) {
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/* If the test is changed, and somehow src1 is used multiple times,
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* nir_ssa_def_bits_used will accumulate *all* the uses (as it should).
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* This isn't what we're trying to test here.
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*/
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ASSERT_TRUE(is_used_once(src1));
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alu->src[1].swizzle[0] = i;
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const uint64_t bits_used = nir_ssa_def_bits_used(alu->src[0].src.ssa);
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EXPECT_EQ(0xffu << (8 * src1_imm[i]), bits_used);
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}
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}
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